Revisiting contrast mechanism of lateral piezoresponse force microscopy

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Piezoresponse force microscopy (PFM) has been widely used for the nanoscale analysis of piezoelectric properties and ferroelectric domains. Although PFM is useful because of its simple and nondestructive features, PFM measurements can be obscured by non-piezoelectric effects that could affect the PFM signals or lead to ferroelectric-like behaviors in non-ferroelectric materials. Many research studies have addressed related technical issues, but they have primarily focused on vertical PFM. Here, we investigate significant discrepancies in lateral PFM signals between the trace and the retrace scans, which are proportional to the scan angle and the cantilever lateral tilting discrepancy. The discrepancies in PFM signals are analyzed based on intrinsic and extrinsic components, including out-of-plane piezoresponse, electrostatic force, and other factors. Our research will contribute to the accurate PFM measurements for the visualization of ferroelectric in-plane polarization distributions.
Publisher
AIP Publishing
Issue Date
2023-12
Language
English
Article Type
Article
Citation

JOURNAL OF APPLIED PHYSICS, v.134, no.21

ISSN
0021-8979
DOI
10.1063/5.0177164
URI
http://hdl.handle.net/10203/317879
Appears in Collection
MS-Journal Papers(저널논문)
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