A large-signal model of RF LDMOS with skin effects of power combining structures
- Publisher
- IEEE
- Issue Date
- 2005-06-12
- Language
- English
- Description
The authors would like to thank Taeho Kim (KAIST), Sanghoon Jeon and Jiyoun Lim (Knowledge*on, Inc.) for their technical support.
- Citation
2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers, pp.149 - 152
- ISSN
- 1529-2517
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
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