A Scalable Readout IC Based on Wideband Noise Cancelling for Full-Rate Scanning of High-Density Microelectrode Arrays

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dc.contributor.authorKim, Jinukko
dc.contributor.authorShin, Hongseokko
dc.contributor.authorKweon, Soon-Jaeko
dc.contributor.authorLee, Seongwookko
dc.contributor.authorHa, Sohmyungko
dc.contributor.authorJe, Minkyuko
dc.date.accessioned2023-09-05T12:00:22Z-
dc.date.available2023-09-05T12:00:22Z-
dc.date.created2023-09-05-
dc.date.issued2021-11-01-
dc.identifier.citation2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), pp.7344 - 7347-
dc.identifier.issn1557-170X-
dc.identifier.urihttp://hdl.handle.net/10203/312234-
dc.description.abstractThis paper presents a highly scalable readout IC for high-density microelectrode arrays (MEAs). Although the recent development of large-scale high-density MEAs provides opportunities to achieve sub-cellular neural recording over a wide network area, it is challenging to implement the readout IC that can operate with such MEAs. The requirement of high-speed recording in large-scale arrays induces wideband-noise folding, which makes it challenging to achieve a good noise performance for high-fidelity neural recording. Moreover, for the wideband readout, the major noise contributor changes from the readout circuit to the cell-electrode interface. In this paper, we first show why the interface noise becomes the dominant noise source and elucidate its component that contributes the most: sealing resistance. Then, we propose a new readout circuit structure, which can effectively cancel the wideband interface noise. As a result, the signal-to-noise ratio of input neural spike signals is improved dramatically in all cell-attachment or sealing conditions. Particularly, it is shown that under weakly sealed conditions, the spikes can be detected only when the proposed wideband noise cancellation technique is applied.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleA Scalable Readout IC Based on Wideband Noise Cancelling for Full-Rate Scanning of High-Density Microelectrode Arrays-
dc.typeConference-
dc.identifier.wosid000760910506222-
dc.identifier.scopusid2-s2.0-85122491766-
dc.type.rimsCONF-
dc.citation.beginningpage7344-
dc.citation.endingpage7347-
dc.citation.publicationname2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)-
dc.identifier.conferencecountryMX-
dc.identifier.conferencelocationVirtual-
dc.identifier.doi10.1109/embc46164.2021.9630796-
dc.contributor.localauthorJe, Minkyu-
dc.contributor.nonIdAuthorKim, Jinuk-
dc.contributor.nonIdAuthorKweon, Soon-Jae-
dc.contributor.nonIdAuthorLee, Seongwook-
dc.contributor.nonIdAuthorHa, Sohmyung-
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