학위논문(박사) - 한국과학기술원 : 수리과학과, 2023.2,[iv, 51 p. :]
Defect inspection▼asemiconductor image▼aFast-MCD method▼aneural network▼adouble-fit method▼asingular value decomposition; 결함 검사▼a반도체 영상▼a빠른 최소 공분산 행렬식 방법▼a신경망▼a이중 적합 방법▼a특이값 분해
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.