Elasticity measurement device탄성도 측정 장치

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An elasticity measurement apparatus includes a lower layer structure having first and second openings, first and second deformable membranes covering the first and second openings to define first and second chamber and deformable by pressure within the first and second chambers respectively, a support layer structure on the lower layer structure to protrude and configured to support the first and second deformable membranes to be spaced apart from the elastic body, a driving portion to apply pressure within the first and second chambers to deform the first and second deformable membranes, and first and second deformation detecting portions to detect deformations of first and second deformable membranes. When the pressure within the first and second chambers is increased from a first pressure to a second pressure, the first deformable membrane is deformed with contacting the elastic body, while the second deformable membrane is deformed without contacting the elastic body.
Assignee
KAIST
Country
US (United States)
Application Date
2018-07-24
Application Number
16633205
Registration Date
2022-07-12
Registration Number
11385149
URI
http://hdl.handle.net/10203/298000
Appears in Collection
BiS-Patent(특허)
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