Unsupervised Blur Kernel Estimation and Correction for Blind Super-Resolution

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Blind super-resolution (blind-SR) is an important task in the field of computer vision and has various applications in real-world. Blur kernel estimation is the main element of blind-SR along with the adaptive SR networks and a more accurately estimated kernel guarantees a better performance. Recently, generative adversarial networks (GANs), comparing recurrence patches across scales, have been the most successful unsupervised kernel estimation methods. However, they still involve several problems. (1) Their sharpness discrimination ability has been noted as being too weak, causing them to focus more on pattern shapes than sharpness. (2) In some cases, kernel correction processes were omitted; however, these are essential because the optimally generated kernel may be narrower than a point spread function (PSF) except when the PSF is ideal low-pass filter. (3) Previous studies also did not consider that GANs are affected by the thickness of edges as well as PSF. Thus, in this paper, 1) we propose a degradation and ranking comparison process designed to induce GAN models to became sensitive to image sharpness, and 2) propose a scale-free kernel correction technique using Gaussian kernel approximation including a thickness parameter. To improve the kernel accuracy further, we 3) propose a combination model of the proposed GAN and DIP(deep image prior) for more supervision, and designed a kernel correction network to propagate gradients through developed correction method. Several experiments demonstrate that our methods enhanced the l(2) error and the shape of the kernel significantly. In addition, by combining with ordinary blind-SR algorithms, the best reconstruction accuracy was achieved among unsupervised blur kernel estimation methods.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2022
Language
English
Article Type
Article
Citation

IEEE ACCESS, v.10, pp.45179 - 45189

ISSN
2169-3536
DOI
10.1109/ACCESS.2022.3170053
URI
http://hdl.handle.net/10203/296569
Appears in Collection
EE-Journal Papers(저널논문)
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