Spectroscopic Sensing Method of Liquid Permittivity with On-Chip CapacitorSpectroscopic Sensing Method of Liquid Permittivity with On-Chip Capacitor

Cited 4 time in webofscience Cited 0 time in scopus
  • Hit : 280
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorLim, Hongkieko
dc.contributor.authorLee, Dong-Hoko
dc.contributor.authorKim, Jusungko
dc.contributor.authorHong, Songcheolko
dc.date.accessioned2022-04-15T06:48:18Z-
dc.date.available2022-04-15T06:48:18Z-
dc.date.created2022-04-04-
dc.date.created2022-04-04-
dc.date.created2022-04-04-
dc.date.created2022-04-04-
dc.date.issued2022-01-
dc.identifier.citationJOURNAL OF ELECTROMAGNETIC ENGINEERING AND SCIENCE, v.22, no.1, pp.28 - 33-
dc.identifier.issn2671-7255-
dc.identifier.urihttp://hdl.handle.net/10203/294803-
dc.description.abstractA liquid permittivity sensing method is proposed, which is based on measuring the S-21 of an on-chip capacitor submerged in a material under test (MUT). The real part of permittivity can be estimated from epsilon' - vertical bar S-21 vertical bar fitted relation in the frequency range of 100 MHz-5 GHz, which are pre-calibrated with four kinds of known materials. The on-chip capacitor is realized with a top metal in a complementary metal oxide semiconductor (CMOS) process, which has an inter-digitized structure featuring a small size of 150 mu m X 195 mu m. A simple circuit model of the capacitor is used to develop epsilon' - vertical bar S-21&VERBAR relation with a fitting parameter. It shows less than 6.4% root-mean-square (rms) error of epsilon' for propanol (C3H8O) at 100 MHz-5 GHz.-
dc.languageEnglish-
dc.publisherKOREAN INST ELECTROMAGNETIC ENGINEERING & SCIENCE-
dc.titleSpectroscopic Sensing Method of Liquid Permittivity with On-Chip Capacitor-
dc.title.alternativeSpectroscopic Sensing Method of Liquid Permittivity with On-Chip Capacitor-
dc.typeArticle-
dc.identifier.wosid000767363600005-
dc.identifier.scopusid2-s2.0-85125267727-
dc.type.rimsART-
dc.citation.volume22-
dc.citation.issue1-
dc.citation.beginningpage28-
dc.citation.endingpage33-
dc.citation.publicationnameJOURNAL OF ELECTROMAGNETIC ENGINEERING AND SCIENCE-
dc.identifier.doi10.26866/jees.2022.1.r.57-
dc.identifier.kciidART002810866-
dc.contributor.localauthorHong, Songcheol-
dc.contributor.nonIdAuthorLim, Hongkie-
dc.contributor.nonIdAuthorLee, Dong-Ho-
dc.contributor.nonIdAuthorKim, Jusung-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCalibration-
dc.subject.keywordAuthorCapacitive Sensor-
dc.subject.keywordAuthorCurve Fitting-
dc.subject.keywordAuthorDielectric Spectroscopy-
dc.subject.keywordAuthorInter-Digitized-
dc.subject.keywordPlusDIELECTRIC-SPECTROSCOPY-
dc.subject.keywordPlusGHZ-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 4 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0