DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Yong Keun | ko |
dc.contributor.author | Yoon, JongHee | ko |
dc.contributor.author | Lee, KyeoReh | ko |
dc.contributor.author | Kim, Young Dug | ko |
dc.contributor.author | Kim, Nam Kyun | ko |
dc.date.accessioned | 2022-04-13T07:17:50Z | - |
dc.date.available | 2022-04-13T07:17:50Z | - |
dc.identifier.uri | http://hdl.handle.net/10203/292689 | - |
dc.description.abstract | Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector. | - |
dc.title | Apparatus for Detecting Sample Properties Using Chaotic Wave Sensor | - |
dc.title.alternative | 혼돈파 센서를 이용한 시료 특성 탐지 장치 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Park, Yong Keun | - |
dc.contributor.nonIdAuthor | Yoon, JongHee | - |
dc.contributor.nonIdAuthor | Kim, Young Dug | - |
dc.contributor.nonIdAuthor | Kim, Nam Kyun | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 17142529 | - |
dc.identifier.patentRegistrationNumber | 11262287 | - |
dc.date.application | 2021-01-06 | - |
dc.date.registration | 2022-03-01 | - |
dc.publisher.country | US | - |
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