Apparatus for Detecting Sample Properties Using Chaotic Wave Sensor혼돈파 센서를 이용한 시료 특성 탐지 장치

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Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.
Assignee
KAIST
Country
US (United States)
Application Date
2021-01-06
Application Number
17142529
Registration Date
2022-03-01
Registration Number
11262287
URI
http://hdl.handle.net/10203/292689
Appears in Collection
PH-Patent(특허)
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