A 80x60 Microbolometer CMOS Thermal Imager Integrated With a Low-Noise 12-B DAC

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A low-cost 80x60 microbolometer CMOS (complementary metal-oxide-semiconductor) thermal imager is presented. The imager system integrated with a proposed 12-b biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300x faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference. The low-noise biasing DAC adopts a current-mode divider-stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-b biasing DAC in a 0.18 mu m CMOS imager IC has a low noise of 1.89 mu V-rms and INL (integral non-linearity)/DNL (differential non-linearity) of 0.14/0.09 LSB, respectively.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2022-08
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.69, no.8, pp.8604 - 8608

ISSN
0278-0046
DOI
10.1109/TIE.2021.3109542
URI
http://hdl.handle.net/10203/292516
Appears in Collection
EE-Journal Papers(저널논문)
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