DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Weon-Guk | ko |
dc.contributor.author | Han, Joon-Kyu | ko |
dc.contributor.author | Tcho, Il-Woong | ko |
dc.contributor.author | Park, Jun-Young | ko |
dc.contributor.author | Yu, Ji-Man | ko |
dc.contributor.author | Choi, Yang-Kyu | ko |
dc.date.accessioned | 2020-10-20T01:55:10Z | - |
dc.date.available | 2020-10-20T01:55:10Z | - |
dc.date.created | 2020-10-05 | - |
dc.date.created | 2020-10-05 | - |
dc.date.issued | 2020-10 | - |
dc.identifier.citation | NANO ENERGY, v.76, pp.105000 | - |
dc.identifier.issn | 2211-2855 | - |
dc.identifier.uri | http://hdl.handle.net/10203/276681 | - |
dc.description.abstract | A metal-oxide-semiconductor field-effect transistor (MOSFET), which is an elementary unit of microelectronics, was repaired by self-powered electro-thermal annealing with the aid of a wind-driven triboelectric nanogenerator (TENG). It was thermally cured by Joule heat that originated electrically from the MOSFET itself. The configuration of the self-curable system is composed of a MOSFET with an embedded built-in Joule heater and a wind-driven TENG. This self-curable feature is attractive for the construction of remote wireless sensor networks, is capable of sustainable operation for long-term use, has high immunity against external environmental stress as well as internal operation stress, and can reduce labor during the periodic replacement of power sources. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.title | Triboelectric nanogenerator for a repairable transistor with self-powered electro-thermal annealing | - |
dc.type | Article | - |
dc.identifier.wosid | 000571043100004 | - |
dc.identifier.scopusid | 2-s2.0-85086709566 | - |
dc.type.rims | ART | - |
dc.citation.volume | 76 | - |
dc.citation.beginningpage | 105000 | - |
dc.citation.publicationname | NANO ENERGY | - |
dc.identifier.doi | 10.1016/j.nanoen.2020.105000 | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | MOSFET | - |
dc.subject.keywordAuthor | Transistor | - |
dc.subject.keywordAuthor | Tri-gate FinFET | - |
dc.subject.keywordAuthor | Joule heat | - |
dc.subject.keywordAuthor | Triboelectric nanogenerator | - |
dc.subject.keywordAuthor | TENG | - |
dc.subject.keywordAuthor | Electro-thermal annealing | - |
dc.subject.keywordAuthor | Self-repair | - |
dc.subject.keywordAuthor | Self-curing | - |
dc.subject.keywordAuthor | gamma-ray irradiation | - |
dc.subject.keywordPlus | WIND-SPEED SENSOR | - |
dc.subject.keywordPlus | INTERFACE-TRAP | - |
dc.subject.keywordPlus | SYSTEM DRIVEN | - |
dc.subject.keywordPlus | DEGRADATION | - |
dc.subject.keywordPlus | GENERATION | - |
dc.subject.keywordPlus | RECOVERY | - |
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