Generator Polynomial Model-Based Eye Diagram Estimation Method for Bose-Chaudhuri-Hocquenghem (BCH) Code and Reed-Solomon (RS) Code

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dc.contributor.authorPark, Junyongko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2020-04-17T05:20:12Z-
dc.date.available2020-04-17T05:20:12Z-
dc.date.created2018-12-24-
dc.date.issued2020-02-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.62, no.1, pp.240 - 248-
dc.identifier.issn0018-9375-
dc.identifier.urihttp://hdl.handle.net/10203/273918-
dc.description.abstractThis paper proposes a generator polynomial model-based eye diagram estimation method for the error-correction codes (ECCs), which are the Bose–Chaudhuri–Hocquenghem (BCH) code and the Reed–Solomon (RS) code. The ECCs compensate for the channel loss at the bit level, so most of the systems include the ECC block. The BCH and RS codes are the generator polynomial-based ECCs; this paper proposes the generator polynomial model-based method. The model provides the accurate probability density function of the code words for the BCH and RS code. Thus, the proposed method is capable of achieving the signal integrity analysis for the system level. For verification, we design the BCH and RS encoders. The estimated eye diagrams are nearly the same as that of the transient simulation for the BCH and RS codes. Furthermore, the voltage bathtub curves are the same up to 10−8. For a smaller bit-error rate value, the proposed method only provides the bathtub curve. This paper successfully verifies the eye diagram estimation method for the BCH and RS codes.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleGenerator Polynomial Model-Based Eye Diagram Estimation Method for Bose-Chaudhuri-Hocquenghem (BCH) Code and Reed-Solomon (RS) Code-
dc.typeArticle-
dc.identifier.wosid000521967400026-
dc.identifier.scopusid2-s2.0-85057836657-
dc.type.rimsART-
dc.citation.volume62-
dc.citation.issue1-
dc.citation.beginningpage240-
dc.citation.endingpage248-
dc.citation.publicationnameIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY-
dc.identifier.doi10.1109/TEMC.2018.2881146-
dc.contributor.localauthorKim, Joungho-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorGenerators-
dc.subject.keywordAuthorEstimation-
dc.subject.keywordAuthorProbability density function-
dc.subject.keywordAuthorEncoding-
dc.subject.keywordAuthorError correction codes-
dc.subject.keywordAuthorMathematical model-
dc.subject.keywordAuthorSignal integrity-
dc.subject.keywordAuthorBose-Chaudhuri-Hocquenghem (BCH) code-
dc.subject.keywordAuthorencoding-
dc.subject.keywordAuthorerror-correction code (ECC)-
dc.subject.keywordAuthorerror resilience-
dc.subject.keywordAuthoreye diagram-
dc.subject.keywordAuthorI-
dc.subject.keywordAuthorO subsystems-
dc.subject.keywordAuthorReed-Solomon (RS) code-
dc.subject.keywordAuthorsignal integrity (SI)-
dc.subject.keywordAuthorstochastic eye diagram-
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