A Study on the Flexible Chip-on-Fabric Assemblies Using Anisotropic Conductive Films and Metal-Laminated Fabric Substrates

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dc.contributor.authorJung, Seung-Yoonko
dc.contributor.authorLee, Tae-Ikko
dc.contributor.authorCho, Minsunko
dc.contributor.authorKim, Taek-Sooko
dc.contributor.authorPaik, Kyung-Wookko
dc.date.accessioned2020-04-13T06:20:24Z-
dc.date.available2020-04-13T06:20:24Z-
dc.date.created2020-04-08-
dc.date.created2020-04-08-
dc.date.created2020-04-08-
dc.date.created2020-04-08-
dc.date.issued2020-03-
dc.identifier.citationIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.10, no.3, pp.360 - 367-
dc.identifier.issn2156-3950-
dc.identifier.urihttp://hdl.handle.net/10203/273877-
dc.description.abstractIn this article, chip-on-fabric (COFa) assemblies using anisotropic conductive films (ACFs) and metal-laminated fabric substrates were investigated. To fabricate the metal-laminated fabric substrates, electroless nickel-immersion gold (ENIG) metal-finished Cu circuits were fabricated on the B-stage nonconductive films (NCFs), followed by laminating onto the fabrics. Then, the 50- $\mu \text{m}$ -thick Si chip was bonded onto the fabric substrates using ACFs with a thermocompression (T/C) bonding method. First, the ACFs' joint properties, such as electrical resistances and adhesion strengths, were evaluated and compared with conventional chip-on-flex (COF) assembly. To enhance static bending flexibility without chip fracture, chip-in-fabric (CIFa) assemblies were developed after optimizing the thickness of a cover layer on the Si chip. Finally, mechanical and moisture-related reliability of the CIFa packages was evaluated through dynamic bending, 85 degrees C/85% relative humidity (RH), and washing reliability.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA Study on the Flexible Chip-on-Fabric Assemblies Using Anisotropic Conductive Films and Metal-Laminated Fabric Substrates-
dc.typeArticle-
dc.identifier.wosid000520493900002-
dc.identifier.scopusid2-s2.0-85081995962-
dc.type.rimsART-
dc.citation.volume10-
dc.citation.issue3-
dc.citation.beginningpage360-
dc.citation.endingpage367-
dc.citation.publicationnameIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY-
dc.identifier.doi10.1109/TCPMT.2020.2968359-
dc.contributor.localauthorKim, Taek-Soo-
dc.contributor.localauthorPaik, Kyung-Wook-
dc.contributor.nonIdAuthorCho, Minsun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorAnisotropic conductive film (ACF)-
dc.subject.keywordAuthorbending test-
dc.subject.keywordAuthorchip on fabric (COFa)-
dc.subject.keywordAuthorflexibility-
dc.subject.keywordAuthormetal-laminated fabric substrate-
dc.subject.keywordAuthorwashability-
dc.subject.keywordPlusBENDING RELIABILITY-
dc.subject.keywordPlusABSORPTION-
dc.subject.keywordPlusSENSORS-
dc.subject.keywordPlusFIBERS-
dc.subject.keywordPlusGLASS-
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