Polynomial Model-Based Eye Diagram Estimation Methods for LFSR-Based Bit Streams in PRBS Test and Scrambling

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dc.contributor.authorPark, Junyongko
dc.contributor.authorPark, Shinyoungko
dc.contributor.authorKim, Youngwooko
dc.contributor.authorPark, Gapyeolko
dc.contributor.authorPark, Hyunwookko
dc.contributor.authorLho, Daehwanko
dc.contributor.authorCho, Kyungjunko
dc.contributor.authorLee, Seongsooko
dc.contributor.authorKim, Dong-Hyunko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2020-02-07T06:20:10Z-
dc.date.available2020-02-07T06:20:10Z-
dc.date.created2018-12-24-
dc.date.created2018-12-24-
dc.date.issued2019-12-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.61, no.6, pp.1867 - 1875-
dc.identifier.issn0018-9375-
dc.identifier.urihttp://hdl.handle.net/10203/272157-
dc.description.abstractThis paper proposes eye diagram estimation methods for linear feedback shift register (LFSR)-based bit streams in pseudorandom binary sequence (PRBS) test and scrambling. The PRBS test uses the LFSR as a random data source; scrambling suppresses the radiated EMI by exclusive-OR (XOR) between the data and the LFSR. Both cases include the LFSR as the last block, thus, the LFSR dominantly determines the eye diagram. This paper introduced the deterministic and statistical eye diagram for the PRBS test and scrambling, respectively. The deterministic eye diagram was verified by comparing to the measurement; the statistical eye diagram was verified by comparing to the transient simulation. We also compared the voltage bathtub curves for the scrambling. The measurement and proposed method were correlated up to the BER of 10-10.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titlePolynomial Model-Based Eye Diagram Estimation Methods for LFSR-Based Bit Streams in PRBS Test and Scrambling-
dc.typeArticle-
dc.identifier.wosid000522641000020-
dc.identifier.scopusid2-s2.0-85077735338-
dc.type.rimsART-
dc.citation.volume61-
dc.citation.issue6-
dc.citation.beginningpage1867-
dc.citation.endingpage1875-
dc.citation.publicationnameIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY-
dc.identifier.doi10.1109/TEMC.2019.2900055-
dc.contributor.localauthorKim, Joungho-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorElectromagnetic compatibility (EMC)-
dc.subject.keywordAuthorelectromagnetic interference (EMI)-
dc.subject.keywordAuthoreye diagram-
dc.subject.keywordAuthorhigh-speed channel-
dc.subject.keywordAuthorlinear-feedback shift register (LFSR)-
dc.subject.keywordAuthorpseudorandom binary sequence (PRBS)-
dc.subject.keywordAuthorscrambling-
dc.subject.keywordAuthorsignal integrity (SI)-
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