Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets

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This letter derives bounds on performance degradation due to measurement noise in millimeter wave beam alignment methods that train a subset of beam pairs. The analysis applies the union bound and pairwise beam selection error for a wideband channel. While the analysis is oblivious to the method to select the subset of beam pairs, inverse fingerprinting beam alignment is used as a concrete numerical example. Performance evaluation results for different bandwidths show that a wideband system suffers less from measurement noise with the same training sequence duration.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2018-10
Language
English
Article Type
Article
Citation

IEEE WIRELESS COMMUNICATIONS LETTERS, v.7, no.5, pp.784 - 787

ISSN
2162-2337
DOI
10.1109/LWC.2018.2825326
URI
http://hdl.handle.net/10203/267354
Appears in Collection
EE-Journal Papers(저널논문)
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