DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Jae Roung | ko |
dc.contributor.author | Lim, Cheol Woo | ko |
dc.contributor.author | Park, Byeong-Jin | ko |
dc.contributor.author | Song, Byeongju | ko |
dc.contributor.author | Sohn, Hoon | ko |
dc.date.accessioned | 2019-04-30T02:32:23Z | - |
dc.date.available | 2019-04-30T02:32:23Z | - |
dc.date.issued | 2019-03-05 | - |
dc.identifier.uri | http://hdl.handle.net/10203/261644 | - |
dc.description.abstract | A non-contact durability diagnosis apparatus includes: (a) applying non-contactly and sequentially at least two excitation ultrasonic waves to an object and storing frequency signals generated from the object; (b) applying non-contactly and simultaneously the at least two excitation ultrasonic waves to the object and storing frequency signals generated from the object; (c) storing derived frequency signals remaining after removing an overlapping portion of the frequency signals of step (a) and the frequency signals of step (b); and (d) determining that the object is damaged when at least one of the generated frequency signals of step (c) is larger than a predetermined value. | - |
dc.title | Non-contact durability diagnosis apparatus and method | - |
dc.title.alternative | 비접촉 내구 진단 장치 및 방법 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Sohn, Hoon | - |
dc.contributor.nonIdAuthor | Park, Jae Roung | - |
dc.contributor.nonIdAuthor | Lim, Cheol Woo | - |
dc.contributor.nonIdAuthor | Park, Byeong-Jin | - |
dc.contributor.nonIdAuthor | Song, Byeongju | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 14955910 | - |
dc.identifier.patentRegistrationNumber | 10222354 | - |
dc.date.application | 2015-12-01 | - |
dc.date.registration | 2019-03-05 | - |
dc.publisher.country | US | - |
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