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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

혼합된 PAM Mapping과 LDPC 부호의 Trapping Set 감소

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강순영 / Piao Yanji / 문재균researcher
Publisher
IEEK
Issue Date
2011-06-22
Language
Korean
Citation

IEEK SUMMER CONFERENCE

URI
http://hdl.handle.net/10203/260031
Appears in Collection
EE-Conference Papers(학술회의논문)
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