Investigation of LC-VCO Performance Degradation due to TSV-Coupled Noise in 3D IC

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Publisher
2013 Asia-Pacific Radio Science Conference (AP-RASC 2013)
Issue Date
2013-09-03
Language
English
Citation

2013 Asia-Pacific Radio Science Conference (AP-RASC 2013)

URI
http://hdl.handle.net/10203/257376
Appears in Collection
EE-Conference Papers(학술회의논문)
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