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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Detection of the Interface-Trap Charge Density and Lateral Nonuniformity of Through-Silicon Vias Kim, Kibeom; Ahn, Jangyong; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.28, no.5, pp.422 - 424, 2018-05
2	An Improved 100 GHz Equivalent Circuit Model of a Through Silicon Via With Substrate Current Loop Kim, Kibeom; Hwang, Karam; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.26, no.6, pp.425 - 427, 2016-06

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Kim, Kibeom; Ahn, Jangyong; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.28, no.5, pp.422 - 424, 2018-05

Kim, Kibeom; Hwang, Karam; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.26, no.6, pp.425 - 427, 2016-06

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