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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity Cho, Jaeyong; Kim, Byung-Sung; Jeong, Jonghyuk; Kim, Junseong; Kim, Kibeom; Hwang, Karam; Lee, Hwiseob; Jeung, Seungil; Ahn, Seungyoung, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.27, no.10, pp.936 - 938, 2017-10 | |
| E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung, MICROELECTRONICS RELIABILITY, v.98, pp.161 - 164, 2019-07 | |
| Low- and High-Frequency Extrapolation of Band-Limited Frequency Responses to Extract Delay Causal Time Responses Cho, Jaeyong; Ahn, Jangyong; Kim, Jongwook; Park, Jaehyoung; Shin, Yujun; Kim, Kibeom; Choi, Junsung; Ahn, Seungyoung, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.63, no.3, pp.888 - 901, 2021-06 |
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