DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jang, Yoon-Soo | ko |
dc.contributor.author | Kim, Seung-Woo | ko |
dc.date.accessioned | 2019-01-22T08:32:40Z | - |
dc.date.available | 2019-01-22T08:32:40Z | - |
dc.date.created | 2018-12-11 | - |
dc.date.created | 2018-12-11 | - |
dc.date.issued | 2018-09 | - |
dc.identifier.citation | Nanomanufacturing and Metrology, v.1, no.3, pp.131 - 147 | - |
dc.identifier.issn | 2520-811X | - |
dc.identifier.uri | http://hdl.handle.net/10203/249040 | - |
dc.description.abstract | We present a progress review on the advance of distance measurements made at KAIST by making use of mode-locked lasers as the light source to meet ever-growing industrial demands on the measurement precision and functionality. Diverse principles exploited for the progress are described in this review with focus on four attributes: first, the optical spectrum of a mode-locked laser, distinctively called the frequency comb, permits multi-wavelength interferometry to be realized for absolute distance measurement up to several meters without losing the nanometer precision of well-established laser-based phase-measuring displacement measurement. Second, the frequency comb enables spectrally resolved interferometry for absolute distance measurement to be conducted with a nanometer resolution by Fourier transform analysis of the dispersive interference data captured using a spectrometer. Third, the mode-locked laser in the time domain appears as a train of ultrashort pulses, of which the time-of-flight is measured with a picosecond resolution by control of the pulse repetition rate with reference to the radio-frequency atomic clock. Fourth, the pulse-to-pulse cross-correlation occurring in the optical frequency domain is down-converted to the radio-frequency domain to achieve femtosecond pulse timing precision by means of dual-comb interference. All these principles based on unique spectral and temporal characteristics of ultrashort mode-locked lasers are anticipated to make contributions to the advance of nanotechnology particularly in manufacturing and metrology. | - |
dc.language | English | - |
dc.publisher | Springer Singapore | - |
dc.title | Distance Measurements Using Mode-Locked Lasers: A Review | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 1 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 131 | - |
dc.citation.endingpage | 147 | - |
dc.citation.publicationname | Nanomanufacturing and Metrology | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.description.isOpenAccess | N | - |
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