Distance Measurements Using Mode-Locked Lasers: A Review

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dc.contributor.authorJang, Yoon-Sooko
dc.contributor.authorKim, Seung-Wooko
dc.date.accessioned2019-01-22T08:32:40Z-
dc.date.available2019-01-22T08:32:40Z-
dc.date.created2018-12-11-
dc.date.created2018-12-11-
dc.date.issued2018-09-
dc.identifier.citationNanomanufacturing and Metrology, v.1, no.3, pp.131 - 147-
dc.identifier.issn2520-811X-
dc.identifier.urihttp://hdl.handle.net/10203/249040-
dc.description.abstractWe present a progress review on the advance of distance measurements made at KAIST by making use of mode-locked lasers as the light source to meet ever-growing industrial demands on the measurement precision and functionality. Diverse principles exploited for the progress are described in this review with focus on four attributes: first, the optical spectrum of a mode-locked laser, distinctively called the frequency comb, permits multi-wavelength interferometry to be realized for absolute distance measurement up to several meters without losing the nanometer precision of well-established laser-based phase-measuring displacement measurement. Second, the frequency comb enables spectrally resolved interferometry for absolute distance measurement to be conducted with a nanometer resolution by Fourier transform analysis of the dispersive interference data captured using a spectrometer. Third, the mode-locked laser in the time domain appears as a train of ultrashort pulses, of which the time-of-flight is measured with a picosecond resolution by control of the pulse repetition rate with reference to the radio-frequency atomic clock. Fourth, the pulse-to-pulse cross-correlation occurring in the optical frequency domain is down-converted to the radio-frequency domain to achieve femtosecond pulse timing precision by means of dual-comb interference. All these principles based on unique spectral and temporal characteristics of ultrashort mode-locked lasers are anticipated to make contributions to the advance of nanotechnology particularly in manufacturing and metrology.-
dc.languageEnglish-
dc.publisherSpringer Singapore-
dc.titleDistance Measurements Using Mode-Locked Lasers: A Review-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume1-
dc.citation.issue3-
dc.citation.beginningpage131-
dc.citation.endingpage147-
dc.citation.publicationnameNanomanufacturing and Metrology-
dc.contributor.localauthorKim, Seung-Woo-
dc.description.isOpenAccessN-
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