On the detection of multiple events in atom probe tomography

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dc.contributor.authorPeng, Zirongko
dc.contributor.authorVurpillot, Francoisko
dc.contributor.authorChoi, Pyuck-Pako
dc.contributor.authorLi, Yujiaoko
dc.contributor.authorRaabe, Dierkko
dc.contributor.authorGault, Baptisteko
dc.date.accessioned2018-06-16T07:37:01Z-
dc.date.available2018-06-16T07:37:01Z-
dc.date.created2018-04-03-
dc.date.created2018-04-03-
dc.date.issued2018-06-
dc.identifier.citationULTRAMICROSCOPY, v.189, pp.54 - 60-
dc.identifier.issn0304-3991-
dc.identifier.urihttp://hdl.handle.net/10203/242534-
dc.description.abstractIn atom probe tomography (APT), multiple events can arise as a consequence of e.g. correlated field evaporation and molecular ion dissociation. They represent challenging cases for single-particle detectors and can cause compositional as well as spatial inaccuracies. Here, two state-of-the-art atom probe microscopes (Cameca LEAP 5000 XS and 5000 XR) were used to investigate cemented tungsten carbide, which exhibits high amounts of multiple events. By advanced data analysis methods, the natural character of the multiple events, as well as the performance of the APT detectors, are assessed. Accordingly, possible signal loss mechanisms are discussed. (C) 2018 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectFIELD EVAPORATION-
dc.subjectMASS-SPECTRA-
dc.subjectSTEELS-
dc.titleOn the detection of multiple events in atom probe tomography-
dc.typeArticle-
dc.identifier.wosid000432868500005-
dc.identifier.scopusid2-s2.0-85044595654-
dc.type.rimsART-
dc.citation.volume189-
dc.citation.beginningpage54-
dc.citation.endingpage60-
dc.citation.publicationnameULTRAMICROSCOPY-
dc.identifier.doi10.1016/j.ultramic.2018.03.018-
dc.contributor.localauthorChoi, Pyuck-Pa-
dc.contributor.nonIdAuthorPeng, Zirong-
dc.contributor.nonIdAuthorVurpillot, Francois-
dc.contributor.nonIdAuthorLi, Yujiao-
dc.contributor.nonIdAuthorRaabe, Dierk-
dc.contributor.nonIdAuthorGault, Baptiste-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorAtom probe tomography-
dc.subject.keywordAuthorMultiple event-
dc.subject.keywordAuthorDelay line detector-
dc.subject.keywordAuthorDead time-
dc.subject.keywordAuthorDead zone-
dc.subject.keywordAuthorChemical quantification-
dc.subject.keywordPlusFIELD EVAPORATION-
dc.subject.keywordPlusMASS-SPECTRA-
dc.subject.keywordPlusSTEELS-
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