DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.contributor.author | Kang, Dong Kyun | ko |
dc.date.accessioned | 2017-12-21T00:52:03Z | - |
dc.date.available | 2017-12-21T00:52:03Z | - |
dc.identifier.uri | http://hdl.handle.net/10203/237013 | - |
dc.description.abstract | The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy. Optic-axes of the first and second birefringence wave plates exist on the same plane, optic-axes of the first and second birefringence wave plates are inclined from an optical axis of the entire optical system at a predetermined angle, and self-interference spatial periods of the first and second birefringence wave plates are different from each other. | - |
dc.title | Confocal self-interference microscopy from which side lobe has been removed | - |
dc.title.alternative | 사이드 로브가 제거된 공초점 자가 간섭 현미경 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Kang, Dong Kyun | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 11444686 | - |
dc.identifier.patentRegistrationNumber | 7324273 | - |
dc.date.application | 2006-06-01 | - |
dc.date.registration | 2008-01-29 | - |
dc.publisher.country | US | - |
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