Probe card and method for producing the same프로브 카드 및 그 제조방법

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A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly.
Assignee
KAIST
Country
US (United States)
Issue Date
2007-07-24
Application Date
2005-11-28
Application Number
11287455
Registration Date
2007-07-24
Registration Number
7248064
URI
http://hdl.handle.net/10203/230132
Appears in Collection
ME-Patent(특허)
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