Infrared sensor chip, infrared detector and an operating method and test method therefor

Abstract

The invention provides an infrared sensor chip, an infrared detector and an operating method and a test method therefor. According to one embodiment, provided is an infrared sensor chip comprising: a CMOS circuit board which incorporates an active matrix, a low-line selector and an output multiplexer; and a bolometer which is stacked on top of the CMOS circuit board and incorporates an active cell and a reference cell. In the infrared sensor chip, for the purpose of operational, final and parametric testing of the bolometer in the form of a wafer or a chip, the low-line selector selects a cell that will be subject to voltage application in the bolometer, and the output multiplexer outputs current characteristics that accord with the voltage application.