Ask the Mutants: Mutating faulty programs for fault localization

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dc.contributor.authorMoon, Seokhyeonko
dc.contributor.authorKim, Yunhoko
dc.contributor.authorKim, Moonzooko
dc.contributor.authorYoo, Shinko
dc.date.accessioned2017-06-20T01:59:35Z-
dc.date.available2017-06-20T01:59:35Z-
dc.date.created2017-06-19-
dc.date.created2017-06-19-
dc.date.issued2014-04-02-
dc.identifier.citation7th IEEE International Conference on Software Testing, Verification and Validation, ICST 2014, pp.153 - 162-
dc.identifier.urihttp://hdl.handle.net/10203/224158-
dc.description.abstractWe present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2. © 2014 IEEE.-
dc.languageEnglish-
dc.publisherIEEE Computer Society-
dc.titleAsk the Mutants: Mutating faulty programs for fault localization-
dc.typeConference-
dc.identifier.wosid000355985000018-
dc.identifier.scopusid2-s2.0-84903134795-
dc.type.rimsCONF-
dc.citation.beginningpage153-
dc.citation.endingpage162-
dc.citation.publicationname7th IEEE International Conference on Software Testing, Verification and Validation, ICST 2014-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationHyatt Regency Arcade in downtown Cleveland-
dc.identifier.doi10.1109/ICST.2014.28-
dc.contributor.localauthorYoo, Shin-
dc.contributor.nonIdAuthorMoon, Seokhyeon-
dc.contributor.nonIdAuthorKim, Yunho-
dc.contributor.nonIdAuthorKim, Moonzoo-
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