KAIST Approach for Submicron Device Modeling
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwyro | - |
| dc.date.accessioned | 2011-01-04T07:25:23Z | - |
| dc.date.available | 2011-01-04T07:25:23Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1991-10 | - |
| dc.identifier.citation | Technical digest of International Conference on VLSI and CAD, v., no., pp.376 - 381 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/21360 | - |
| dc.description.sponsorship | The author wish to thank his coworkers all around the world, C. K. Park at KAIST, K. M. Rho at Hyundai, B. J. Moon at Vitesse, Y. Byun at Zerox, M. S. Shur at Univ. of Virginia, and T. A. Fjeldly at Norwegian Institute of Technology. | en |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | Technical digest of International Conference on VLSI and CAD | - |
| dc.title | KAIST Approach for Submicron Device Modeling | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 376 | - |
| dc.citation.endingpage | 381 | - |
| dc.citation.publicationname | Technical digest of International Conference on VLSI and CAD | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
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