Preface of EML PVSEC-25 Special Issue

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dc.contributor.authorAhn, Byung Taeko
dc.contributor.authorShin, Byunghako
dc.contributor.authorOh, Jihunko
dc.date.accessioned2016-09-06T08:55:00Z-
dc.date.available2016-09-06T08:55:00Z-
dc.date.created2016-08-02-
dc.date.created2016-08-02-
dc.date.issued2016-07-
dc.identifier.citationELECTRONIC MATERIALS LETTERS, v.12, no.4, pp.425 - 425-
dc.identifier.issn1738-8090-
dc.identifier.urihttp://hdl.handle.net/10203/212387-
dc.languageEnglish-
dc.publisherKOREAN INST METALS MATERIALS-
dc.titlePreface of EML PVSEC-25 Special Issue-
dc.typeArticle-
dc.identifier.wosid000379226000001-
dc.identifier.scopusid2-s2.0-84979058579-
dc.type.rimsART-
dc.citation.volume12-
dc.citation.issue4-
dc.citation.beginningpage425-
dc.citation.endingpage425-
dc.citation.publicationnameELECTRONIC MATERIALS LETTERS-
dc.identifier.doi10.1007/s13391-016-4000-5-
dc.contributor.localauthorAhn, Byung Tae-
dc.contributor.localauthorShin, Byungha-
dc.contributor.nonIdAuthorOh, Jihun-
dc.description.isOpenAccessN-
dc.type.journalArticleEditorial Material-
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