DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bang, Jun-Suk | ko |
dc.contributor.author | Kim, Hyun-Sik | ko |
dc.contributor.author | Kim, Ki-Duk | ko |
dc.contributor.author | Kwon, Oh-Jo | ko |
dc.contributor.author | Shin, Choong-Sun | ko |
dc.contributor.author | Lee, Joohyung | ko |
dc.contributor.author | Cho, Gyu-Hyeong | ko |
dc.date.accessioned | 2016-07-05T07:51:50Z | - |
dc.date.available | 2016-07-05T07:51:50Z | - |
dc.date.created | 2015-11-23 | - |
dc.date.created | 2015-11-23 | - |
dc.date.created | 2015-11-23 | - |
dc.date.created | 2015-11-23 | - |
dc.date.issued | 2016-04 | - |
dc.identifier.citation | IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.51, no.4, pp.966 - 978 | - |
dc.identifier.issn | 0018-9200 | - |
dc.identifier.uri | http://hdl.handle.net/10203/209227 | - |
dc.description.abstract | An active matrix organic light emitting diode (AMOLED) display driver IC, enabling real-time thin-film transistor (TFT) nonuniformity compensation, is presented with a hybrid driving method to satisfy fast driving speed, high TFT current accuracy, and a high aperture ratio. The proposed hybrid column-driver IC drives a mobile UHD (3840 x 2160) AMOLED panel, with one horizontal time of 7.7 mu s at a scan frequency of 60 Hz, simultaneously senses the TFT current for back-end TFT variation compensation. Due to external compensation, a simple 3T1C pixel circuit is employed in each pixel. Accurate current sensing and high panel noise immunity is guaranteed by a proposed current-sensing circuit. By reusing the hybrid column-driver circuitries, the driver embodies an 8 bit current-mode ADC to measure OLED V-I transfer characteristic for OLED luminance-degradation compensation. Measurement results show that the hybrid driving method reduces the maximum current error between two emulated TFTs with a 60 mV threshold voltage difference under 1 gray-level error of 0.94 gray level (37 nA) in 8 bit gray scales from 12.82 gray level (501 nA). The circuit-reused current-mode ADC achieves 0.56 LSB DNL and 0.75 LSB INL. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | A Hybrid AMOLED Driver IC for Real-Time TFT Nonuniformity Compensation | - |
dc.type | Article | - |
dc.identifier.wosid | 000374404300017 | - |
dc.identifier.scopusid | 2-s2.0-84969326994 | - |
dc.type.rims | ART | - |
dc.citation.volume | 51 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 966 | - |
dc.citation.endingpage | 978 | - |
dc.citation.publicationname | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - |
dc.identifier.doi | 10.1109/JSSC.2015.2504416 | - |
dc.contributor.localauthor | Kim, Hyun-Sik | - |
dc.contributor.localauthor | Cho, Gyu-Hyeong | - |
dc.contributor.nonIdAuthor | Kim, Ki-Duk | - |
dc.contributor.nonIdAuthor | Kwon, Oh-Jo | - |
dc.contributor.nonIdAuthor | Shin, Choong-Sun | - |
dc.contributor.nonIdAuthor | Lee, Joohyung | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | Active matrix organic light emitting diode (AMOLED) | - |
dc.subject.keywordAuthor | circuit-reused current-mode ADC | - |
dc.subject.keywordAuthor | data driver | - |
dc.subject.keywordAuthor | hybrid driver | - |
dc.subject.keywordAuthor | offset-compensated integrating comparator (OCIC) | - |
dc.subject.keywordAuthor | OLED degradation | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
dc.subject.keywordAuthor | threshold voltage shift | - |
dc.subject.keywordAuthor | Active matrix organic light emitting diode (AMOLED) | - |
dc.subject.keywordAuthor | circuit-reused current-mode ADC | - |
dc.subject.keywordAuthor | data driver | - |
dc.subject.keywordAuthor | hybrid driver | - |
dc.subject.keywordAuthor | offset-compensated integrating comparator (OCIC) | - |
dc.subject.keywordAuthor | OLED degradation | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
dc.subject.keywordAuthor | threshold voltage shift | - |
dc.subject.keywordAuthor | Active matrix organic light emitting diode (AMOLED) | - |
dc.subject.keywordAuthor | circuit-reused current-mode ADC | - |
dc.subject.keywordAuthor | data driver | - |
dc.subject.keywordAuthor | hybrid driver | - |
dc.subject.keywordAuthor | offset-compensated integrating comparator (OCIC) | - |
dc.subject.keywordAuthor | OLED degradation | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
dc.subject.keywordAuthor | threshold voltage shift | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | OPERATIONAL-AMPLIFIER | - |
dc.subject.keywordPlus | DISPLAYS | - |
dc.subject.keywordPlus | DEGRADATION | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | OPERATIONAL-AMPLIFIER | - |
dc.subject.keywordPlus | DISPLAYS | - |
dc.subject.keywordPlus | DEGRADATION | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | OPERATIONAL-AMPLIFIER | - |
dc.subject.keywordPlus | DISPLAYS | - |
dc.subject.keywordPlus | DEGRADATION | - |
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