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Results 1-3 of 3 (Search time: 0.005 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Recessed Channel(RC) SOI NMOSFET's with Self-Aligned Polysilicon Gate Formed on the RC Region

Hyung-Cheol Shinresearcher, Proc. IEEE International SOI Conference, pp.122 - 123, 1996

2
Process-Induced Charging Damage in PETEOS for Interlevel Dielectric Applications

Hyung-Cheol Shinresearcher, International Symposium on Plasma Process-Induced Damage, pp.109 - 112, 1996

3
TFSOI Complementary BiCMOS Technology for Low Power RF Mixed-Mode Applications

Hyung-Cheol Shinresearcher, IEEE Custom Integrated Circuits Conference, pp.35 - 38, 1996

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