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Results 1-10 of 34 (Search time: 0.005 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Quantized Canductance of a Gate-All-Around Silicon Quantum Wire Transistor Hyung-Cheol Shinresearcher, MNC(Microprocesses and Nanotechnology Conference, pp.150 - 151, 1998 | |
| Fabrication of siliocon Quantum Dots on Oxide and Nitride Hyung-Cheol Shinresearcher, MNC(Microproceses and Nanotechnology Conference), pp.136 - 137, 1998 | |
| Characteristics of Thermal Nitride Grown by IR Furnace Hyung-Cheol Shinresearcher, IUMRS-ICEM-98, pp.106 - 106, 1998 | |
| Characterization of Thin Oxide Damage During Aluminum Etching and Photoresist Ashing Processes Hyung-Cheol Shinresearcher, International Symposium on VLSI Technology,Systems and Applications, pp.210 - 213, 1991 | |
| Effect of Body Structure on Analog Performance of SOI NMOSFET's Hyung-Cheol Shinresearcher, IEEE SOI Conference, pp.61 - 62, 1998 | |
| Silicon nano-crystal memory with tunneling nitride Hyung-Cheol Shinresearcher, International Conference on Solid State Devices and Materials, pp.170 - 171, 1998 | |
| Factors Affecting Charge-up in a Magnetically Enhanced RIE Polysilicon Etcher Hyung-Cheol Shinresearcher, Proc. Electrochemical Society, pp.405 - 406, 1993 | |
| Thin Oxide Damage by Plasma Etching and Ashing Processes Hyung-Cheol Shinresearcher, Proc. IEEE International Reliability Phys. Symp., pp.37 - 41, 1992 | |
| Characterization of Process-Induced Damage During Aluminum Etching and Photoresist Ashing Hyung-Cheol Shinresearcher, International Wafer Level Reliability Workshop, pp.133 - 144, 1991 | |
| A nano-structure Memory with SOI Edge channel and A nano dot Hyung-Cheol Shinresearcher, MNC(Microproceses and Nanotechnology Conference), pp.315 - 316, 1998 |