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Results 21-30 of 34 (Search time: 0.005 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
21
Materials, Device and Gate Oxide Integrith Evaluation of Simox and Bonded SOI Wafers

Hyung-Cheol Shinresearcher, Proc. IEEE International SOI Conference, pp.143 - 145, 1995

22
Integrity of Gate Oxide on TFSOI Materials

Hyung-Cheol Shinresearcher, Proc. IEEE International SOI Conference, pp.22 - 23, 1995

23
PMOS-based Si Nano-crystal Memory

Hyung-Cheol Shinresearcher, Silicon nanoelectronics workshop, pp.10 - 11, 1999

24
Characteristics of P-channel Si Nano-crystal Memory with Tunneling Oxide

Hyung-Cheol Shinresearcher, 99 ISDRS, pp.73 - 75, 1999

25
Characteristics of P-channel Si Nano-crystal Memory

Hyung-Cheol Shinresearcher, IEEE Region 10 Ionference, TENCON, pp.1140 - 1142, 1999

26
A self-assembled silicon quantum dot transistor operation at room temperature

Hyung-Cheol Shinresearcher, NPMS'98, 1998

27
Lateral Silicon Field Emission Devices using Electron Beam Lithography

Hyung-Cheol Shinresearcher, Micoroprocesses and Nanotechnology'99, pp.134 - 135, 1999

28
Transient Behaviors in Partially Depleted Thin Film SOI Devices

Hyung-Cheol Shinresearcher, Proc. IEEE International SOI Conference, pp.4 - 6, 1995

29
A self-assembled silicon quantum dot transistor operation at room temperature

Hyung-Cheol Shinresearcher, Sound Quality Symposium Conference(SQS), 1998

30
Characterization of oxide Charging in a Magnetically Enhanced Rie Polysilicon Etcher

Hyung-Cheol Shinresearcher, Proc. 11th International Syposium on Plasma Chemistry, pp.1534 - 1539, 1993

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