Browse "RIMS Conference Papers" by Author Yanghua Xia

Showing results 1 to 1 of 1

1
A comparative study of failure mechanisms of Sn-Ag-Cu assemblies under temperature cycling and board level drop test

Yanghua Xia; Xiaoming Xie, International Symposium on High Density Packaging and Microsystem Integration 2007, HDP'07, IEEE, 2007-06-26

rss_1.0 rss_2.0 atom_1.0