Browse "RIMS Conference Papers" by Author Shin J.-A.

Showing results 1 to 1 of 1

1
Definition and extraction of causal relations for QA on fault diagnosis of devices

Lee S.-M.; Shin J.-A., 20th IEEE International Conference on Tools with Artificial Intelligence, ICTAI'08, pp.82 - 88, 2008-11-03

rss_1.0 rss_2.0 atom_1.0