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Breakdown of barkhausen critical scaling behavior with increasing domain wall pinning in fe thin films Lee, Hun-sung; Ryu, Kwang-su; You, Chun-yeol; Jeon, Kun-rok; Parkin, Stuart S. P.; Shin, Sung-Chul, The 19th International Conference on Magnetism (ICM2012), International Union of Pure and Applied Physics, 2012-07-13 |
Effect of spin relaxation rate on the interfacial spin depolarization in ferromagnet/oxide/semiconductor contacts Jeon, Kun-rok; Min, Byoung-chul; Park, Youn-ho; Jo, Young-hun; Lee, Hun-sung; Park, Chang-yup; Shin, Sung-Chul, The 19th International Conference on Magnetism (ICM2012), International Union of Pure and Applied Physics, 2012-07-12 |
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