Browse "School of Electrical Engineering(전기및전자공학부)" by Type Conference

Showing results 12121 to 12140 of 22767

12121
Meaningful scene filtering for TV terminals

Jin, S.H.; Cho, J.H.; Ro, YongMan; Hong, J.W., International Conference on Consumer Electronics, ICCE '06, v.2006, pp.405 - 406, IEEE, 2006-01-07

12122
Measure of Inconsisency and Its Application to Multi-Objective Control

Bien, Zeung nam, International Conference on Fuzzy Sysem Theories and Its Applicaton, pp.1 - 3, 1996

12123
Measure of Inconsistency and its Application to Multi-Objective Control

Bien, Zeung nam, FUZZ IEEE 1997, pp.743 - 747, 1997

12124
Measure of System Intelligence: An Engineering Perspective

Bien, Zeung nam, the Performance Metrics for Intelligent Systems Workshop (NIST), 2000

12125
Measurement and analysis of Micro-Doppler Signature from Rotating Propellers

김동찬; 박성욱; 신동헌, 2015년 하계종합학술대회, 한국전자파학회, 2015-08-20

12126
Measurement and analysis of vertical noise coupling on low noise amplifier from on-chip switching-mode DC-DC converter in 3D-IC

Koo, Kyoungchoul; Kim, Myunghoi; Lee, Sangrok; Kim Joungho, 2011 IEEE Electromagnetic Compatibility Symposium, pp.22 - 27, 2011 IEEE Electromagnetic Compatibility Symposium, 2011-08-17

12127
Measurement and Analysis of Voltage Transfer Ratio (VTR) of Package-level WPT considering PDN Conditions

Kim, Joungho; Song, Eunseok; Kim, Hongseok; Kim, Jonghoon J; Kim, Jiseong, 2013 Asia-Pacific EMC, 2013 Asia-Pacific EMC, 2013-05-20

12128
Measurement and Analysis of Weather Phenomena with K-Band Rain Radar

Park, Jun-Hyeong; Park, Seong-Ook; Kong, Ki-Bok, 2016 URSI Asia-Pacific Radio Science Conference, KIEES,U.R.S.I, 2016-08-24

12129
Measurement and Analysis of Wireless Power Distribution Network using Magnetic Field Resonance in 3D Package and IC

Kim, Joung-Ho; Song, Eunseok; Jung, Daniel H.; Kim, Youngwoo, 2014 International Symposium on Electromagnetic Compatability, Tokyo(EMC2014), 2014 International Symposium on Electromagnetic Compatability, Tokyo(EMC2014), 2014-05-15

12130
Measurement and Comparative Analysis of Shielding Effectiveness of Different Sputtered Materials

Kim, Joungho; Song, Kyunghwan; Cho, Yeonje; Kim, Subin; Jeong, Seungtaek, IEEE International Symposium on Electromagnetic Compatibility, IEEE International Symposium on Electromagnetic Compatibility, 2017-08-09

12131
Measurement and Modeling the Power Consumption of Router Interface

Ahn, Jae Won; Park, Hong-Shik, THE 16TH INTERNATIONAL CONFERENCE ON ADVANCED COMMUNICATIONS TECHNOLOGY(ICACT2014), Global IT Research Institute(GiRI), 2014-02-16

12132
Measurement Based Delay Performance Estimation in ATM Networks

Sung, Dan Keun; Nam, SY, IEEE, 2000-11

12133
Measurement error mitigation

Seo, SeungChan; Bae, Joonwoo, 17th Conference on the Theory of Quantum Computation, Communication and Cryptography, The University of Illinois, 2022-07-11

12134
Measurement Machine Intelligence of Surface Mountion Machine using Choquet Integral

Kim, Jong-Hwan, World Automation Congress, pp.0 - 0, 1998-05-01

12135
Measurement of Acoustic Noise Effect Due to the Gradient Pulsing in functional Magnetic Resonance Imaging (fMRI)

Chung, SungTaek; Song, InChan; Park, HyunWook, SPIE Proceedings, pp.530 - 537, International Society for Optical Engineering (SPIE), 1999-02

12136
Measurement of critical temporal inconsistency for quality assessment of synthesized video

Kim, Hak Gu; Ro, Yong Man, IEEE international conference on image processing (ICIP), IEEE, 2016-09-25

12137
Measurement of decay time of phosphor layers including Ne plasma emission in a surface-discharge ac-PDPs

Choi, Kyung Cheol, , 2000-12

12138
Measurement of exceptional motion in VR video contents for VR sickness assessment using deep convolutional autoencoder

Kim, Hak Gu; Alhaj Baddar, Wissam; Lim, Heoun-taek; Jeong, Hyunwook; Ro, Yong Man, 23rd ACM Conference on Virtual Reality Software and Technology, VRST 2017, pp.1 - 7, Association for Computing Machinery, 2017-11-08

12139
Measurement of High-bandwidth and High-density Silicone Rubber Socket up to 110GHz

Park, Junyong; Kim, Joungho; Kim, Hyesoo; Kim, Jonghoon J; Bae, Bumhee; Ha, Dongho; Bae, Michael, 66th Electronic Components and Technology Conference (ECTC), 66th Electronic Components and Technology Conference (ECTC), 2016-05-31

12140
Measurement of Machine Intelligence of Surface Mounting Machine using Choquet Integral

Kim, Jong-Hwan, World Automation Congress, pp.621 - 626, 1998-05-01

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