Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 15781 to 15800 of 50978

15781
Effects of back-reflection in WDM-PONs based on seed light injection

Moon, JH; Choi, KM; Mun, SG; Lee, Chang-Hee, IEEE PHOTONICS TECHNOLOGY LETTERS, v.19, no.24, pp.2045 - 2047, 2007-11

15782
Effects of Beamforming on Uplink OFDMA System over Time-Selective Fading Channels

Chang, K; Han, Youngnam, JCCI 2004, v.0, no.0, pp.0 - 0, 한국통신학회, 2004

15783
Effects of Bragg reflector annealing on performance factors of FBAR-based ultramass-sensitive sensors

Yim, Munhyuk; Lee, Eunju; Kim, Yeongseon; Yoon, Giwan, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.57, no.9, pp.2134 - 2137, 2015-09

15784
Effects of Buffer Structures of InGaAs MESFETs.

Kwon, Young Se; Hong, Songcheol; Lee, JJ; Kim, DW; Lee, HG; Pyun, KE; Kwon, YS, International Symposium on Compound Semiconductors, 1995

15785
Effects of bulk photoconductivity on photocurrent action spectra of molecular p-n heterojunction solar cells

Shevaleevskiy, O; Larina, L; Myong, SY; Lim, Koeng Su, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.1, pp.1 - 4, 2006

15786
Effects of Carrier-Velocity Saturation in the LDD Region on the Characteristics of Short Chanel LDD MOSFET

Hong, Songcheol; Lee, M; Lee, J; Kang, K; Yoon, K, ISDRS, pp.477 - 480, 1991

15787
EFFECTS OF CARRIER-VELOCITY SATURATION ON THE CHARACTERISTICS OF SHORT CHANNEL MOSFETS WITH LIGHTLY DOPED DRAINS

LEE, MB; LEE, JI; KANG, KN; YOON, KS; Hong, Songcheol; LIM, KY, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.131, no.1, pp.77 - 80, 1992-05

15788
Effects of Clock Offset on TDOA Localization

Park, SeongOok, 2006 International Symposium on Ubiquitous Computing Systems, 2006-10

15789
Effects of Closed-Loop Devices on Omnidirectional Beam Patterns Radiated from WAVE Monopole Antennas

Kim, Hong-Chan; Oh, Sang-Jin; Park, Chul-Soon, APPLIED SCIENCES-BASEL, v.12, no.22, 2022-11

15790
Effects of composition and thickness of TiN metal gate on the equivalent oxide thickness and flat-band voltage in metal oxide semiconductor devices

Lee, Seok-Hee; Choi, Rino; Choi, Changhwan, MICROELECTRONIC ENGINEERING, v.109, pp.160 - 162, 2013-09

15791
Effects of cross talk in WDM system using spectrum-sliced light sources

Jang, Y.S.; Lee, Chang-Hee; Chung, Yun Chur, Proceedings of the 1998 Optical Fiber Communication Conference, OFC'98, pp.128 - 129, Optical Fiber Communication Conference, 1998-02-22

15792
Effects of crosstalk in WDM systems using spectrum-sliced light sources

Jang, YS; Lee, Chang-Hee; Chung, YC, IEEE PHOTONICS TECHNOLOGY LETTERS, v.11, no.6, pp.715 - 717, 1999-06

15793
Effects of Cu diffusion on MOSFET electrical properties

Cho, Byung Jin; Zhu, C; Yoo, WJ; Tan, DPP; Lim, SY, 18th International VLSI Multilevel Interconnection Conf. (VMIC), pp.0 - 0, 2001-11-28

15794
EFFECTS OF DECISION AMBIGUITY LEVEL ON OPTICAL RECEIVER SENSITIVITY

Lee, Chang-Hee; PARK, MS, IEEE PHOTONICS TECHNOLOGY LETTERS, v.7, no.10, pp.1204 - 1206, 1995-10

15795
Effects of Deposition Temperature on ZnO Crystal Growth and FBAR Devices Fabrication

Yoon, Giwan, Progress in Electromagnetics Research Symposium, pp.445 - 445, 2003-10

15796
Effects of dielectric materials on electromigration failure

Doan, J.C.; Lee, S.; Lee, Seok-Hee; Flinn, P.A.; Bravman, J.C.; Marieb, T.N., JOURNAL OF APPLIED PHYSICS, v.89, no.12, pp.7797 - 7808, 2001-06

15797
Effects of downstream modulation formats on the performance of a RSOA-based WDM PON

Kim, S.Y.; Son, E.S.; Jun, S.B.; Lee, J.H.; Lee, D.H.; Sim, E.D.; Chung, Yun Chur, Optical Transmission, Switching, and Subsystems IV, v.6353 I, 2006-09-05

15798
Effects of downstream modulation formats on the performance of bidirectional WDM-PON using RSOA

Kim, S.Y.; Son, E.S.; Jun, S.B.; Chung, Yun Chur, Optical Fiber Communication and the National Fiber Optic Engineers Conference, OFC/NFOEC 2007, 2007-03-25

15799
Effects of Electrical and Optical Equalizations in 28-Gb/s RSOA-Based WDM PON

Shim, Hyun Kyu; Kim, Hoon; Chung, Yun-Chur, IEEE PHOTONICS TECHNOLOGY LETTERS, v.28, no.22, pp.2537 - 2540, 2016-11

15800
EFFECTS OF ELECTRON-BEAM DAMAGE ON THE ELECTRICAL CHARACTERISTICS OF N-TYPE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTORS

Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.3A, pp.1223 - 1227, 1994

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