Browse "School of Electrical Engineering(전기및전자공학부)" byTitle

Showing results 20681 to 20700 of 46580

20681
Investigation of interaction between graphene and dielectrics

Song, Seung Min; Cho, Byung Jinresearcher, NANOTECHNOLOGY, v.21, no.33, 2010-08

20682
Investigation of Isolation-Dielectric Effects of PDSOI FinFET on Capacitorless 1T-DRAM

Ryu, Seong-Wan; Han, Jin-Woo; Kim, Chung-Jin; Choi, Yang-Kyuresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.56, no.12, pp.3232 - 3235, 2009-12

20683
Investigation of LC-VCO Performance Degradation due to TSV-Coupled Noise in 3D IC

Kim, Jounghoresearcher; Lim, Jaemin; Cho, Jonghyun; Lee, Manho; Park, Kunwoo; Lee, Junho, 2013 Asia-Pacific Radio Science Conference (AP-RASC 2013), 2013 Asia-Pacific Radio Science Conference (AP-RASC 2013), 2013-09-03

20684
Investigation of Leaky Characteristic in a Single-Transistor-Based Leaky Integrate-and-Fire Neuron

Han, Joon-Kyu; Kim, Myung-Su; Kim, Seung-Il; Lee, Mun-Woo; Lee, Sang-Won; Yu, Ji-Man; Choi, Yang-Kyuresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5912 - 5915, 2021-11

20685
Investigation of link formation in a novel planar-type antifuse structure

Baek, Jong Tae; Park, Hyung-Ho; Kang, Sang-Wonresearcher; Ahn, Byung Taeresearcher; Yoo, Hyung Jounresearcher, THIN SOLID FILMS, v.288, no.1-2, pp.41 - 44, 1996-11

20686
Investigation of Low-Frequency Noise in Nonvolatile Memory Composed of a Gate-All-Around Junctionless Nanowire FET

Jeong, Ui-Sik; Kim, Choong-Ki; Bae, Hagyoul; Moon, Dong-Il; Bang, Tewook; Choi, Ji-Min; Hur, Jae; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.5, pp.2210 - 2213, 2016-05

20687
Investigation of multicomponent diffusion in cat brain using a combined MTC-DWI approach

Ronen, I; Moeller, S; Ugurbil, K; Kim, Dae-Shikresearcher, MAGNETIC RESONANCE IMAGING, v.24, pp.425 - 431, 2006-05

20688
Investigation of Object Thickness for Visual Discomfort Prediction in Stereoscopic Images

Ro, YongManresearcher; Sohn, Hosik; Jung, YongJu; Lee, Seong Il; Park,HyunWook, IS&T/SPIE EI 2012 (Stereoscopic Displays and Applications XXIII ), v.8288, IS&T/SPIE EI 2012, 2012-01-22

20689
Investigation of optical frequency comb generation with sharp spectral edges using external modulators

Oh, Jaemin; Kim, Hoon; Chung, Yun-Chur, Optoelectronics and Communications Conference (OECC) 2015, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2015-07-01

20690
Investigation of optimal hydrogen sensing performance in semiconducting carbon nanotube network transistors with palladium electrodes

Choi, Bongsik; Lee, Dongil; Ahn, Jae-Hyuk; Yoon, Jinsu; Lee, Juhee; Jeon, Minsu; Kim, Dong Myong; et al, APPLIED PHYSICS LETTERS, v.107, no.19, 2015-11

20691
Investigation of Physically Unclonable Functions Using Flash Memory for Integrated Circuit Authentication

Kim, Moon-Seok; Moon, Dong-Il; Yoo, Sangkyung; Lee, Sang-Han; Choi, Yang-Kyuresearcher, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.14, no.2, pp.384 - 389, 2015-03

20692
Investigation of Plane-to-Plane Noise Coupling through Cutout in Multi-layer Power/Ground Planes

Kim, Jounghoresearcher; Lee, Junwoo; Seng, Yeo Mui; Iyer, Mahadevan K, IEEE 4th Electronics Packaging Technology Conference, pp.257 - 260, IEEE, 2002-12

20693
Investigation of polymer-free graphene transfer and passivation layer for enhanced reliability of graphene field-effect transistors = 그래핀 소자의 신뢰성 향상을 위한 전사 과정과 부동화 피막에 관한 연구link

Park, Hamin; 박하민; et al, 한국과학기술원, 2015

20694
Investigation of process dependence of graphene growth on nickel thin film

Cho, Byung Jinresearcher; Mun, JH; Hwang, C; Lim, SK, 56th AVS symposium, 2009-11-09

20695
Investigation of pump wavelength dependence of long-wavelength-band erbium-doped fiber amplifier using 1530nm-band pump for WDM amplification

Choi, B.H.; Park, HyoHoonresearcher; Chu, M., Optical Fiber Conference, v.54, pp.0 - 0, 2001-03-17

20696
Investigation of PVD HfO2 MIM capacitors for Si RF and Mixed signal ICs application

Cho, Byung Jinresearcher; Hang, H; Ding, SJ; Zhu, C; Rustagi, RC; Lu, YF; Li, MF, International semiconductor device research symposium, pp.0 - 0, 2003-12-10

20697
Investigation of quasi-breakdown mechanism in ultrathin gate oxides

Cho, Byung Jinresearcher; He, YD; Guan, H; Li, MF; Dong, Z, Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc., pp.0 - 0, 1999-11-29

20698
Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing

Loh, WY; Cho, Byung Jinresearcher; Li, MF, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.5A, pp.2873 - 2877, 2002-05

20699
Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions

Chong, PF; Cho, Byung Jinresearcher; Chor, EF; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.4B, pp.2181 - 2185, 2000-04

20700
Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0