Browse "School of Electrical Engineering(전기및전자공학부)" by Subject z-test
Showing results 1 to 2 of 2
| A Memory-Efficient Unified Early Z-Test Kim, Hong-Yun; Yu, Chang-Hyo; Kim, Lee-Sup, IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.17, no.9, pp.1286 - 1294, 2011-09 |
| An area efficient early Z-test method for 3-D graphics rendering hardware Yu, CH; Kirn, D; Kim, Lee-Sup, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.55, pp.1929 - 1938, 2008-08 |
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