Browse "School of Electrical Engineering(전기및전자공학부)" by Subject internal circuit testing
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| Pulse-coupling measurement of coupled microstrip lines using a micromachined picosecond optical near-field probe Lee, J; Lee, H; Baek, S; Jeong, YC; Kim, Joungho, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.49, no.10, pp.1740 - 1746, 2001-10 |
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