Browse "School of Electrical Engineering(전기및전자공학부)" by Subject very large scale integration
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| A low-noise folded bit-line sensing architecture for multigigabit DRAM with ultrahigh-density 6F(2) cell Kim, JS; Choi, YS; Yoo, Hoi-Jun; Seo, KS, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.33, no.7, pp.1096 - 1102, 1998-07 |
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