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A Universal Core Model for Multiple-Gate Field-Effect Transistors. Part II: Drain Current Model

Duarte, Juan Pablo; Choi, Sung-Jin; Moon, Dong-Il; Ahn, Jae-Hyuk; Kim, Jee-Yeon; Kim, Sung-Ho; Choi, Yang-Kyuresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.2, pp.848 - 855, 2013-02

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