Browse "School of Electrical Engineering(전기및전자공학부)" by Subject radiation hardening▼asingle event effect (SEE)▼atotal ionizing dose effect (TID)▼areliability▼aMOSFET▼aflip-flop
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| (A) study on the radiation hardening design against both single event effect and total ionization dose effect = 단일 사건 영향 및 누적 이온화 영향에 강인한 내방사선 설계 기법에 관한 연구link Roh, Young Tak; Lee, Hee Chul; et al, 한국과학기술원, 2019 |
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