Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectp-type

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P-type floating gate for retention and P/E window improvement of flash memory devices

Shen, Chen; Pu, Jing; Li, Ming-Fu; Cho, Byung Jinresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.54, no.8, pp.1910 - 1917, 2007-08

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