Browse "School of Electrical Engineering(전기및전자공학부)" by Subject oxide trap density
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| Low-frequency noise characteristics of ultrathin body p-MOSFETs with molybdenum gate Lee, JS; Ha, DW; Choi, Yang-Kyu; King, TJ; Bokor, J, IEEE ELECTRON DEVICE LETTERS, v.24, no.1, pp.31 - 33, 2003-01 |
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