Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectnonlocal effect

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1
Body thickness dependence of impact ionization in a multiple-gate FinFET

Han, Jin-Woo; Lee, Jiye; Park, Donggun; Choi, Yang-Kyuresearcher, IEEE ELECTRON DEVICE LETTERS, v.28, no.7, pp.625 - 627, 2007-07

2
Fin-Width Dependence of BJT-Based 1T-DRAM Implemented on FinFET

Moon, Dong-Il; Choi, Sung-Jin; Han, Jin-Woo; Kim, Sung-Ho; Choi, Yang-Kyuresearcher, IEEE ELECTRON DEVICE LETTERS, v.31, no.9, pp.909 - 911, 2010-09

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