Browse "School of Electrical Engineering(전기및전자공학부)" by Subject judder artifacts
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| A New No-Reference Method for Judder Artifact Assessment Oh, Se Ri; Jeong, Seyoon; Heo, Pyeonggang; Kim, Dongchan; Kim, Hui Yong; Park, HyunWook, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.29, no.10, pp.2888 - 2898, 2019-10 |
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