Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectjoule heat

Showing results 1 to 1 of 1

1
Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs

Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyuresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0