Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectinternal circuit testing

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1
Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping

Lee, J; Yu, S; Kim, Jounghoresearcher, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.25, pp.459 - 466, 2002-08

2
Pulse-coupling measurement of coupled microstrip lines using a micromachined picosecond optical near-field probe

Lee, J; Lee, H; Baek, S; Jeong, YC; Kim, Jounghoresearcher, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.49, no.10, pp.1740 - 1746, 2001-10

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