Browse "School of Electrical Engineering(전기및전자공학부)" by Subject critical dimension (CD)
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| Nanoscale CMOS spacer FinFET for the terabit era Choi, Yang-Kyu; King, TJ; Hu, CM, IEEE ELECTRON DEVICE LETTERS, v.23, no.1, pp.25 - 27, 2002-01 |
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